Sensitive measurement of optical nonlinearities using a single beam

IEEE Journal of Quantum Electronics - Tập 26 Số 4 - Trang 760-769 - 1990
Mansoor Sheik‐Bahae1, Ali A. Said1, Tai‐Huei Wei1, David J. Hagan1, Eric W. Van Stryland1
1Center for Res. in Electro-Opt. & Lasers, Univ. of Central Florida, Orlando, FL, USA

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