Semiautomatic measurement of individual orientation of crystals by using etch pits and digitized images

Materials Characterization - Tập 34 - Trang 189-194 - 1995
F. Cruz1, F. Caleyo, T. Baudin2, E. Estevez1, R. Penelle2
1Universidad de la Habana, Facultad de Fisica, IMRE, Laboratorio de Analisis Estructural, San Lazaro Y. L., Habana 4 10400, Cuba
2Université de Paris-Sud, Laboratoire de Métallurgie Structurale, Centre National de la Recherche Scientifique Unité de Recherche Associée 1107, Bâtiment 413, 91405 Orsay Cedex, France

Tài liệu tham khảo

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