Self-Testing Embedded Borden t-UED Code Checkers for t = 2 k q − 1 with q = 2 m − 1
Tóm tắt
Borden codes are optimal nonsystematic t-unidirectional error detecting (t-UED) codes. A possible method to design a Borden code checker is to map the Borden code words to words of an AN arithmetic code and to check the obtained words with an appropriate AN code checker. For t = q − 1 with q = 2
m
− 1 we show how this method can be modified such that the Borden code checkers achieve the self-testing property under very weak conditions. It is only required that no checker input line gets a constant signal and that the Borden code words occur in a random order, making the proposed checkers very suitable for use as embedded checkers. Based on these checkers it is then possible to design embedded Borden t-UED code checkers for t = 2
k
q − 1 with q = 2
m
− 1.
Tài liệu tham khảo
Anderson DA, Metze G (1973) Design of totally self-checking check circuits for m-out-of-n codes. IEEE Trans Comput C-22(3):263–269
Avižienis A (1971) Arithmetic error codes: cost and effectiveness studies for application in digital system design. IEEE Trans Comput 20(11):1322–1331
Biswas GP, Sengupta I (1997) A design technique of TSC checkers for Borden’s code. In: 10th international conference on VLSI design, Hyderabad, pp 529–530, January 1997
Borden JM (1982) Optimal asymmetric error detecting Codes. Inf Control 53:66–73
Chatterjee A, Abraham JA (1987) On the C-testability of generalized counters. IEEE Trans Comput-Aided Des CAD-6(5):713–726
Fujiwara E, Matsuoka K (1987) A self-checking generalized prediction checker and its use for built-in testing. IEEE Trans Comput C-36(1):86–93
Fujiwara E, Pradhan DK (1990) Error-control coding in computers. IEEE Comput 23(7):63–72
Fujiwara E, Yoshikawa M (1992) A design method for cost-effective self-testing checker for optimal d-unidirectional error detecting codes. IEICE Trans Inf Syst E75-D(6):771–777
Haniotakis T, Nikolos D, Paschalis A, Gizopoulos D (1994) Totally self-checking checkers for Borden codes. Int J Electron 76(1):57–64
Haniotakis T, Paschalis A, Nikolos D (1995) Efficient totally self-checking checkers for a class of Borden codes. IEEE Trans Comput 44(11):1318–1322
Jha NK (1989) A totally self-checking checker for Borden’s code. IEEE Trans Comput-aided Des Integr Circuits Syst 8(7):731–736
Metra C, Favalli M, Riccò B (1996) Embedded two-rail checkers with on-line testing ability In: 14th IEEE VLSI test symposium, Princeton, NJ, pp 145–150, April–May 1996
Nikolos D, Kavousianos X (1998) Efficient highly testable Borden code checkers. In: IEEE European test workshop, Sitges, Spain, pp 246–250, May 1998
Nikolos D, Paschalis AM, Philokyprou G (1988) Efficient design of totally self-checking checkers for all low-cost arithmetic codes. IEEE Trans Comput 37(7):807–814
Nikolos D, Paschalis A, Haniotakis T, Laskaris G (1990) Totally self-checking checkers for optimal t-unidirectional error detecting codes. In: 13th Int. conference on fault-tolerant systems and diagnostics, Varna, Bulgaria, pp 326–331, June 1990
Paschalis A, Gizopoulos D, Gaitanis N, Kostarakis P (1996) A totally self-checking checker for all cyclic AN codes In: Min Y, Tang D (eds) Computer-aided design, test, and evaluation for dependability. International Academic Publishers, pp 252–257
Piestrak SJ (1994) Design of residue generators and multioperand modular adders using carry-save adders. IEEE Trans Comput 43(1):68–77
Piestrak SJ (1996) Design of self-testing checkers for Borden codes. IEEE Trans Comput 45(4):461–469
Pradhan DK, Stiffler JJ (1980) Error correcting codes and self-checking circuits in fault-tolerant computers. IEEE Comput 13:27–37
Stroele AP, Tarnick S (1999) Programmable embedded self-testing checkers for all-unidirectional error detecting codes In: Proc. 17th IEEE VLSI test symposium, Dana Point, CA, pp 361–369, April 1999
Stroele AP, Tarnick S (2000) Embedded checker architectures for cyclic and low-cost arithmetic codes. J Electron Test 16(4):355–367
Swartzlander EE Jr (1973) Parallel counters. IEEE Trans Comput C-22(11):1021–1024
Tarnick S (1998) Embedded parity and two-rail TSC checkers with error-memorizing capability. VLSI Des 5(4):347–356
Tarnick S (2004) Design of embedded self-testing checkers for t-UED and BUED codes. J Electron Test 20(5):465–477
Tarnick S (2007) Self-testing embedded borden t-UED code checkers for t = 2k q − 1 with q = 2m − 1. Research Report, 4TECH GmbH, Teltow Germany
Tarnick S (2007) Design of embedded m-out-of-n code checkers using complete parallel counters. In: Proc. 13th IEEE international on-line testing symposium, Hersonissos-Heraklion, Crete, Greece, pp 285–292, July 2007
Wang LT, McCluskey EJ (1986) Complete feedback shift register design for built-in self-test. In: Proc. Int. Conf. on computer-aided design, ICCAD, Santa Clara, CA, pp 56–59, November 1986