Scanning Electron Microscopy and X-ray Microanalysis

Springer US - 2003
Joseph I. Goldstein1, Dale E. Newbury2, Patrick Echlin3, David C. Joy4, Charles E. Lyman5, Eric Lifshin6, Linda C. Sawyer7, Joseph R. Michael8
1University of Massachusetts, Amherst, USA
2National Institute of Standards and Technology, Gaithersburg, USA
3Cambridge Analytical Microscopy Ltd., Cambridge, England
4University of Tennessee, Knoxville, USA
5Lehigh University, Bethlehem, USA
6State University at Albany, Albany, USA
7Ticona LLC, Summit, USA
8[Sandia National Laboratories, Albuquerque, USA]

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