SIMS for analysis of nanostructures
Tài liệu tham khảo
Van der Heide, 2014
Wilson, 1989
Mahoney, 2013
Grice, 2015
Mahoney, 2010, Cluster secondary ion mass spectrometry of polymers and related materials, Mass Spectrom Rev, 29, 247, 10.1002/mas.20233
McPhail, 2006, Applications of secondary ion mass spectrometry (SIMS) in materials science, J Mater Sci, 41, 873, 10.1007/s10853-006-6568-x
Fletcher, 2013, Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions, Anal Chem, 85, 610, 10.1021/ac303088m
Chi-Ming, 2014, Polymer surface structures determined using ToF-SIMS, Rev Anal Chem, 33, 11
Boxer, 2009, Advances in imaging secondary ion mass spectrometry for biological samples, Ann Rev Biophys, 38, 53, 10.1146/annurev.biophys.050708.133634
Thiel, 2011, Using time-of-flight secondary ion mass spectrometry to study biomarkers, Ann Rev Earth Planet Sci, 39, 125, 10.1146/annurev-earth-040610-133525
Harvey, 2015, Direct evidence of enhanced chlorine segregation at grain boundaries in polycrystalline CdTe thin films via three-dimensional TOF-SIMS imaging, Progr Photovolt Res Appl, 23, 838, 10.1002/pip.2498
Wirtz, 2012, Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis, Rev Scientific Instr, 83, 063702, 10.1063/1.4724308
Fornai, 2012, Three-dimensional molecular reconstruction of rat heart with mass spectrometry imaging, Anal Bioanal Chem, 404, 2927, 10.1007/s00216-012-6451-3
Marchany, 2015, Time of flight secondary ion mass spectrometry surface and in-depth study of degradation of nanosheet poly(l-lactic acid) films, Biointerphases, 10, 019010, 10.1116/1.4908206
Szynkowska, 2009, ToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugs, Forensic Sci Int, 184, e24, 10.1016/j.forsciint.2008.11.003
Vandervorst, 2008, Semiconductor profiling with sub-nm resolution: challenges and solutions, Appl Surf Sci, 255, 805, 10.1016/j.apsusc.2008.05.090
Merkulov, 2010, Advanced secondary ion mass spectroscopy quantification in the first few nanometer of B, P, and As ultrashallow implants, J Vacuum Sci Technol B, 28, 10.1116/1.3225588
Dowsett, 2003, Depth profiling using ultra-low-energy secondary ion mass spectrometry, Appl Surf Sci, 203–204, 5, 10.1016/S0169-4332(02)00630-X
Yang, 2013, Depth profiling and melting of nanoparticles in secondary ion mass spectrometry (SIMS), J Phys Chem C, 117, 16042, 10.1021/jp4048538
Hofmeister, 2015, Quantification of nitrogen impurity and estimated Orowan strengthening through secondary ion mass spectroscopy in aluminum cryomilled for extended durations, Mater Sci Eng A, 648, 412, 10.1016/j.msea.2015.09.007
Yuen-Yee, 2014, Effects of initial GaN growth mode on the material and electrical properties of AlGaN/GaN high-electron-mobility transistors, Appl Phys Exp, 7, 095502, 10.7567/APEX.7.095502
Wucher, 2008, Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy, Appl Surf Sci, 255, 984, 10.1016/j.apsusc.2008.05.246
Ngo, 2012, Cs oxide aggregation in SIMS craters in organic samples for optoelectronic application, Surf Sci, 606, 1244, 10.1016/j.susc.2012.04.003
Vanhove, 2011, Zero-energy SIMS depth profiling: the role of surface roughness development with XeF2-based etching, Surf Interface Anal, 43, 159, 10.1002/sia.3616
Moreau, 2007, Extracellular proteins limit the dispersal of biogenic nanoparticles, Science, 316, 1600, 10.1126/science.1141064
Hoppe, 2013, NanoSIMS: technical aspects and applications in cosmochemistry and biological geochemistry, Geostandards Geoanal Res, 37, 111, 10.1111/j.1751-908X.2013.00239.x
Valle, 2011, Nano-SIMS investigation of boron distribution in steels, Surf Interface Anal, 43, 573, 10.1002/sia.3531
Franquet, 2014
Shin, 2011, High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy, Electr Mater Lett, 7, 265, 10.1007/s13391-011-0916-y
Swart, 2012, Identification of Eu oxidation states in a doped Sr5(PO4)3F phosphor by TOF-SIMS imaging, Opt Expr, 20, 17119, 10.1364/OE.20.017119
Shimizu, 1982, Isotope fractionation in secondary ion mass spectrometry, J Appl Phys, 53, 1303, 10.1063/1.330636
Sahu, 2011, Study the hardness properties of TiAlN coatings prepared by magnetron co-sputtering deposited nanoscale multi-layered structure, AIP Conf Proc, 1372, 318, 10.1063/1.3644463
Drozdov, 2012, Quantitative analysis of the elemental composition and electron concentration in AlGaN/GaN heterostructures with a two-dimensional electron channel by means of SIMS and C-V profiling, Bull Russ Acad Sci Phys, 76, 221, 10.3103/S106287381202013X
Chou, 2015, Revealing the planar chemistry of two-dimensional heterostructures at the atomic level, Nat Commun, 6
Schnieders, 2010, In full wafer defect analysis with time-of-flight secondary ion mass spectrometry, 158
Ziemniak, 2006, Corrosion behavior of NiCrFe Alloy 600 in high temperature, hydrogenated water, Corrosion Sci, 48, 498, 10.1016/j.corsci.2005.01.006
Sang Ho, 2015, Improvement in device performance of a-InGaZnO transistors by introduction of Ca-doped Cu source/drain electrode, Electr Dev Lett IEEE, 36, 802, 10.1109/LED.2015.2445348
Dhar, 2013, Two-dimensional profiling of carriers in terahertz quantum cascade lasers using calibrated scanning spreading resistance microscopy and scanning capacitance microscopy, J Microsc, 251, 35, 10.1111/jmi.12040
Perea, 2006, Three-dimensional nanoscale composition mapping of semiconductor nanowires, Nano Letters, 6, 181, 10.1021/nl051602p
Stepien, 2013, ToF-SIMS analysis of UV-switchable TiO2-nanoparticle-coated paper surface, Langmuir, 29, 3780, 10.1021/la304731m
Carraro, 2013, Fluorine doped Fe2O3 nanostructures by a one-pot plasma-assisted strategy, RSC Advan, 3, 23762, 10.1039/c3ra43775b
Höschen, 2015, Novel sample preparation technique to improve spectromicroscopic analyses of micrometer-sized particles, Environ Sci Technol, 49, 9874, 10.1021/acs.est.5b01636
Gázquez, 2015, Magnetic field effect on the corrosion processes at the Eurofer–Pb–17Li flow interface, J Nucl Mater, 465, 633, 10.1016/j.jnucmat.2015.06.024
Schreiber, 2013, Examinations of oxidation and sulfidation of grain boundaries in alloy 600 exposed to simulated pressurized water reactor primary water, Microsc Microanal, 19, 676, 10.1017/S1431927613000421
Christien, 2013, Quantitative grain boundary analysis of bulk samples by SIMS, Surf Interface Anal, 45, 305, 10.1002/sia.4884
Gin, 2011, Nuclear glass durability: new insight into alteration layer properties, J Phys Chem C, 115, 18696, 10.1021/jp205477q
Seebauer, 2010, Trends in semiconductor defect engineering at the nanoscale, Mater Sci Eng R Rep, 70, 151, 10.1016/j.mser.2010.06.007
Seebauer, 2006, Control of defect concentrations within a semiconductor through adsorption, Phys Rev Lett, 97, 055503, 10.1103/PhysRevLett.97.055503
Hollister, 2013, Surface-based manipulation of point defects in rutile TiO2, Appl Phys Lett, 102, 231601, 10.1063/1.4810073
Gorai, 2014, Kinetics of oxygen interstitial injection and lattice exchange in rutile TiO2, Appl Phys Lett, 104, 191602, 10.1063/1.4876916
Gorai, 2012, Mechanism and kinetics of near-surface dopant pile-up during post-implant annealing, J Appl Phys, 111, 094510, 10.1063/1.4714556
Gorai, 2014, Kinetic model for electric-field induced point defect redistribution near semiconductor surfaces, Appl Phys Lett, 105, 021604, 10.1063/1.4890472
Gorai, 2013, Electrostatic drift effects on near-surface defect distribution in TiO2, Appl Phys Lett, 103, 141601, 10.1063/1.4824614
Close, 2015, Reversible oxygen scavenging at room temperature using electrochemically reduced titanium oxide nanotubes, Nat Nano, 10, 418, 10.1038/nnano.2015.51
Seebauer, 2011, Measurement of photostimulated self-diffusion in silicon, J Appl Phys, 109, 103708, 10.1063/1.3590710
Vaidyanathan, 2011, Nonthermal illumination effects on ultra-shallow junction formation, Appl Phys Lett, 98, 194104, 10.1063/1.3571279
Stathopoulos, 2015, Millisecond non-melt laser annealing of phosphorus implanted germanium: influence of nitrogen co-doping, J Appl Phys, 118, 135710, 10.1063/1.4932600
Kondratenko, 2013, Interface-mediated photostimulation effects on diffusion and activation of boron implanted into silicon, ECS J Solid State Sci Technol, 2, P235, 10.1149/2.018305jss
Gorai, 2012, Measurement of defect-mediated oxygen self-diffusion in metal oxides, ECS J Solid State Sci Technol, 1, Q21, 10.1149/2.011202jss
Pangan-Okimoto, 2015, Model for oxygen interstitial injection from the rutile TiO2(110) surface into the bulk, J Phys Chem C, 119, 9955, 10.1021/acs.jpcc.5b02009