Ripples, Wrinkles, and Crumples in Folded Graphene

Journal of the Korean Physical Society - Tập 76 - Trang 985-990 - 2020
You-Shin No1, Ji Hye Lee1, Bae Ho Park1, Jin Sik Choi1
1Department of Physics, Konkuk University, Seoul, Korea

Tóm tắt

Separation of two-dimensional thin-film-materials into single layers had been considered very challenging both theoretically and experimentally until the mechanical exfoliation method was discovered. After the successful separation of single- and/or few-layer graphene, the possibility of wrinkle formation has been one of the main open topics because they were not readily observed in experiments. Here, we report experimental observations of different kinds of repetitive nanoscale deformations (ripples, wrinkles, and crumples) in folded single-layer graphene (SLG) on an SiO2 substrate. Using high-vacuum atomic force microscopy, we observed that SLG that was pre-transferred onto an SiO2 substrate was accidentally folded multiple times during the tip-scanning, resulting in the formation of bilayer and trilayer graphene (TLG). Through high-resolution tapping-mode scanning, we could observe the wrinkles, ripples, and crumples in TLG. Additionally, we observed a herringbone pattern that was attributed to an intermediate stage between the wrinkles and ripples; this intermediate state was labeled as wrinklon structure. In our analysis, to characterize the ripples, wrinkles, and crumples, we measured the spatial repetition and amplitude of each pattern using their average line profile and compared them.

Tài liệu tham khảo

D. Yoon, H. Cheong, J. S. Choi and B. H. Park, J. Korean Phys. Soc. 60, 1278 (2012). V. Carozo et al., Nano Lett. 11, 4527 (2011). B. Wang et al., Nano Lett. 17, 1467 (2017). K. Nagashio et al., J. Appl. Phys. 110, 024513 (2011). W. Gao et al., J. Phys. D: Appl. Phys. 47, 255301 (2014). J. Annett and G. L. W. Cross, Nature 535, 271 (2016). J. S. Choi et al., Rev. Sci. Instrum. 83, 073905 (2012). J. S. Choi et al., Sci. Rep. 4, 7263 (2014). Y. Park et al., Sci. Rep. 5, 9390 (2015). N. D. Mermin, Phys. Rev. 176, 250 (1968). D. R. Nelson and L. Peliti, J. Phys. 48, 1085 (1987). P. L. Doussal and L. Radzihovsky, Phys. Rev. Lett. 69, 1209 (1992). K. S. Novoselov et al., Science 306, 666 (2004). K. S. Novoselov et al., Nature 438, 197 (2005). J. C. Meyer et al., Nature 446, 60 (2007). A. Fasolino, J. H. Los and M. I. Katsnelson, Nat. Mater. 6, 858 (2007). K. Xu, P. Cao and J. R. Heath, Nano Lett. 9, 4446 (2009). J. S. Choi et al., Science 333, 607 (2011). H. Vandeparre et al., Phys. Rev. Lett. 106, 224301 (2011). S. Deng and V. Berry, ACS Appl. Mater. Interfaces 8, 24956 (2016). X. Chen and J. W. Hutchinson, J. Appl. Mech. 71, 597 (2004). C. Lee et al., Science 328, 76 (2010). D. Yoon, Y-W. Son and H. Cheong, Nano Lett. 11, 3227 (2011). S. Deng and V. Berry, Mater. Today 19, 197 (2016). L. Tapasztó et al., Nat. Phys. 8, 739 (2012). L. Meng et al., Phys. Rev. B 87, 205405 (2013).