Retrieval of a wave front with small deformations from a sample of interferograms with a variable number and orientation of interference fringes
Tóm tắt
A new approach to phase retrieval from an interferogram through the application of the classical fringe tracing method to a sample in which interference fringes change their number and orientation is proposed. Wave fronts retrieved from individual interferograms are averaged, and the quality of the studied surface is judged by the estimate found. Phase averaging over several interferograms allows a decrease in the error variance for the retrieved phase, caused not only by random noise, but also nonuniformity of the aperture covering by interference fringes and light source heterogeneity. Results of model experiments carried out show prospects for interferometry in the nanometrology of high-quality optical components.
Tài liệu tham khảo
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