Resolving the multipolar scattering modes of a submicron particle using parametric indirect microscopic imaging

Kaleem Ullah1, Xuefeng Liu1, Alex Krasnok2, Muhammad Habib3, Li Song3, Braulio Garcia-Camara4
1School of Electronic Engineering and Optoelectronics Technology, Nanjing University of Science and Technology, 200 Xiaolingwei, 210094, People’s Republic of China
2Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712, USA
3National Synchrotron Radiation Laboratory, CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei, Anhui, 230029, People’s Republic of China
4Group of Displays and Photonic Applications (GDAF-UC3 M), Carlos III University of Madrid, Leganes, 28911 Madrid, Spain

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