Residual-life distributions from component degradation signals: A Bayesian approach

Informa UK Limited - Tập 37 Số 6 - Trang 543-557 - 2005
Nagi Gebraeel1, Mark Lawley1, Rong Li1, Jennifer K. Ryan1
1School of Industrial Engineering, 1287 Grissom Hall, Purdue University, West Lafayette , IN, 47907, USA E-mail: [email protected]

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