Real-time monitoring of silicon oxide deposition processes

Surface and Coatings Technology - Tập 180 - Trang 655-658 - 2004
C Gravalidis1, M Gioti2, A Laskarakis2, S Logothetidis1
1Department of Physics, Aristotle University of Thessaloniki, GR-54124 Thessaloniki, Greece
2Department of Physics, Aristotle University of Thessaloniki, GR 54124 Thessaloniki, Greece

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