Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes

ACS Nano - Tập 6 Số 11 - Trang 10216-10221 - 2012
Mark P. Boneschanscher1, Joost van der Lit1, Zhixiang Sun1,2, Ingmar Swart1, Peter Liljeroth3, Daniël Vanmaekelbergh1
1Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, P.O. Box 80000, 3508 TA Utrecht, The Netherlands
2Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569, Stuttgart, Germany
3Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland

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