Optimum combined test plans for systems and components
IIE Transactions - 1999
Tóm tắt
Since mathematical models based on component reliabilities are frequently used for prediction of system reliability, it stands to reason that cost-effective inferences on the reliability of a system could be made on the basis of tests of its constituent components. Prior research in the area of system-based component testing has for the most part addressed the development of plans that test only the components. From a practitioner's point of view, this is an issue of concern since system failures are often caused by imperfect interfaces and other causes that are not directly attributable to component failures. The exclusion of system tests may thus be an erroneous approach. This paper addresses the development of test plans that explicitly consider the possibility of interface failures. The paper analyzes a series system to determine when testing should be performed on the system alone, on the components only, and on both, depending on test costs and interface reliabilities. Optimum test plans are derived by solving a two-stage mathematical program.
Từ khóa
Tài liệu tham khảo
Anon. (1987) Reliability test methods, plans, and environments for engineering development, qualification, and production. Report MIL-HDBK-781D. Department of the Navy, Space and Naval Warfare Systems Command, Washington DC.
Rajgopal, J. and Mazumdar, M. (1995) Designing component test plans for system reliability via mathematical programming. International Journal of Reliability, Quality and Safety Engineering, 2(1), 35–48.
Easterling, R.G., Mazumdar, M., Spencer, F.W. and Diegert, K.V. (1990) System based component test plans and operating characteristics: binomial data. Technometrics, 33, 287–298.
Gal, S. (1974) Optimal test design for reliability demonstration. Operations Research, 22, 1236–1244.
Mazumdar, M. (1977) An optimum procedure for component testing in the demonstration of series system reliability. IEEE Transactions on Reliability, R-26, 342–345.
Mazumdar, M. (1980) An optimum procedure for a series system with redundant subsystems. Technometrics, 22, 23–27.
Yan, J.H. and Mazumdar, M. (1986) A comparison of several component testing plans for a series system. IEEE Transactions on Reliability, R-35, 437–443.
Yan, J.H. and Mazumdar, M. (1987) A comparison of several component testing plans for a parallel system. IEEE Transactions on Reliability, R-36, 419–424.
Rajgopal, J. and Mazumdar, M. (1988) A type-II censored, log test±time based component testing procedure for a parallel system. IEEE Transactions on Reliability, 37, 406–412.
Rajgopal, J. and Mazumdar, M. (1995) Designing component test plans for series system reliability via mathematical programming. Technometrics, 37 (2), 195–212.
Rajgopal, J. and Mazumdar, M. (1996) A system based component test plan for a series system, with type-II censoring. IEEE Transactions on Reliability, 45 (3), 375–378.
Altinel, K.I. (1992) The design of optimum component test plans in the demonstration of a series system reliability. Computational Statistics and Data Analysis, 14 (3), 281–292.
Altinel, K.I. (1994) The design of optimum component test plans in the demonstration of system reliability. European Journal of Operational Research, 78, 318–333.
Denson, W. (1997) New system reliability assessment methods. Report of Project No. A06839, Department of Defense, Reliability Analysis Center, Rome, NY.
Murphy, B. and Gent, T. (1995) Measuring system and software reliability using an automated data collection process. Quality and Reliability Engineering International, 11 (5), 341–353.
Easterling, R. G. and Prairie, R. R. (1971) Combining component and system information, Technometrics, 13, 271–280.
Rajgopal, J., Mazumdar, M. and Savits, T.H. (1994) Some properties of the Poisson distribution with an application to reliability testing. Probability in the Engineering and Informational Sciences, 8, 345–354.
