Optimal configuration of partial Mueller matrix polarimeter for measuring the ellipsometric parameters in the presence of Poisson shot noise and Gaussian noise

Naicheng Quan1, Chunmin Zhang2, Tingkui Mu2
1School of Materials Science and Engineering, Xi’an University of Technology, Xi’an, 710048, China
2Institute of space Optics, Xi’an Jiaotong University, Xi’an 710049, China

Tài liệu tham khảo

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