Optical measurements of OLED panels for lighting applications

Journal of Modern Optics - Tập 60 Số 14 - Trang 1176-1186 - 2013
Tokihisa Kawabata1, Yoshi Ohno1
1National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-8442, USA.

Tóm tắt

Từ khóa


Tài liệu tham khảo

CIE Technical Committee. TC 2-68 Optical Measurement Methods for OLEDs used for Lighting. http://div2.60cie.co.at/?i_ca_id=561&pubid=401.

Gerloff, T. Presented at the 11th International Conference on New Developments and Applications in Optical Radiometry, Maui, HI, September 19–23, 2011.

Gerloff, T.; Meyer, M.; Taddeo, M; Sperling, A. InProceedings of the CIE 27th Session, Sun City, South Africa, July 9–16, 2011; International Commission on Illumination (CIE): 2011, pp 599–603.

Hirasawa, M.; Yamauchi, Y. Presented at CIE 2012, Hangzhou, China, September 19–21, 2012.

Itayama, T.; Yamauchi, Y., Hirasawa, M. Presented at CIE 2012, Hangzhou, China, September 19–21, 2012.

Mertens R., 2012, The OLED Handbook: A Guide to OLED Technology, Industry & Market

Oda, A.JELMA J.2008,495, 43–45.

IESNA Testing Procedures Committee.Approved Method: Electrical and Photometric Measurements of Solid-State Lighting Products; Report LM-79-08; Illuminating Engineering Society of North America (IESNA): New York, 2008.

CIE.Characterization of the Performance of Illuminance Meters and Luminance Meters; Report FDIS 023/E:2013; International Commission on Illumination (CIE): 2013.