On the measurement of patent stock as knowledge indicators

Elsevier BV - Tập 73 Số 7 - Trang 793-812 - 2006
Gwangman Park1, Yongtae Park2
1Electronics and Telecommunications Research Institute, 161 Gajeong-Dong, Yuseong-Gu, Daejon, 305-700, Korea
2Department of Industrial Engineering, School of Engineering, Seoul National University (SNU), San 56-1, Shillim-Dong, Kwanak-Gu, Seoul 151-742, Korea

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