On X-Variable Filling and Flipping for Capture-Power Reduction in Linear Decompressor-Based Test Compression Environment

Xiao Liu1, Qiang Xu1,2
1Department of Computer Science and Engineering, Chinese University of Hong Kong, Sha Tin, Hong Kong, China
2Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, China

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Tài liệu tham khảo

10.1109/TCAD.2006.882509

10.1109/TCAD.2008.923111

10.1109/VTEST.2000.843824

ravi, 2007, Power-aware test: Challenges and solutions, Proc IEEE ITC, 1

10.1109/TEST.2008.4700585

10.1109/ICCD.2002.1106816

mrugalski, 2007, New test data decompressor for low power applications, Proc ACM/IEEE DAC, 539

10.1109/VTS.2007.77

ravi, 2007, Methodology for low power test pattern generation using activity threshold control logic, Proc ICCAD, 526

10.1109/12.663775

10.1109/TEST.2004.1386971

10.1109/DATE.2008.4484839

10.1109/TEST.2006.297694

wen, 2005, Low-capture-power test generation for scan-based at-speed testing, Proc IEEE ITC, 1019

wen, 2007, A novel scheme to reduce power supply noise for high-quality at-speed scan testing, Proc IEEE ITC, 1

10.1109/MDT.2006.105

10.1109/DAC.2002.1012710

liu, 2009, A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment, Proc DATE, 1494

10.1109/TCAD.2004.829797

li, 2008, On capture power-aware test data compression for scan-based testing, Proc ICCAD, 67

10.1109/TEST.2008.4700573

10.1109/TEST.2000.894297

wu, 2008, Reducing power supply noise in linear-decompressor-based test data compression environment for at-speed scan testing, Proc IEEE ITC, 1

xu, 2007, Pattern-directed circuit virtual partitioning for test power reduction, Proc IEEE ITC, 1

10.1109/VTS.2001.923464

10.1109/92.585217

10.1109/MDT.2002.1003802

samii, 2006, Cycle-accurate test power modeling and its application to SoC test scheduling, Proc IEEE ITC, 1

10.1109/TEST.2009.5355554

10.1109/TCAD.2003.811451

10.1109/MDT.2002.1033794

10.1109/TCAD.2003.811452

10.1109/TCAD.2004.826558

10.1109/TEST.2001.966711

10.1109/TEST.2005.1584057

10.1109/MDT.2008.56