On X-Variable Filling and Flipping for Capture-Power Reduction in Linear Decompressor-Based Test Compression Environment
Tóm tắt
Từ khóa
Tài liệu tham khảo
ravi, 2007, Power-aware test: Challenges and solutions, Proc IEEE ITC, 1
mrugalski, 2007, New test data decompressor for low power applications, Proc ACM/IEEE DAC, 539
ravi, 2007, Methodology for low power test pattern generation using activity threshold control logic, Proc ICCAD, 526
wen, 2005, Low-capture-power test generation for scan-based at-speed testing, Proc IEEE ITC, 1019
wen, 2007, A novel scheme to reduce power supply noise for high-quality at-speed scan testing, Proc IEEE ITC, 1
liu, 2009, A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment, Proc DATE, 1494
li, 2008, On capture power-aware test data compression for scan-based testing, Proc ICCAD, 67
wu, 2008, Reducing power supply noise in linear-decompressor-based test data compression environment for at-speed scan testing, Proc IEEE ITC, 1
xu, 2007, Pattern-directed circuit virtual partitioning for test power reduction, Proc IEEE ITC, 1
samii, 2006, Cycle-accurate test power modeling and its application to SoC test scheduling, Proc IEEE ITC, 1