Nondestructive testing of ceramic capacitors by partial discharge method

Materials Letters - Tập 50 - Trang 82-86 - 2001
Byoung-Chul Shin1, Sung-Chul Kim2, Choon-Woo Nahm3, Seung-Ju Jang4
1Department of Advanced Materials Engineering, Dong-eui University, Pusan, South Korea
2Department of Physics, Dong-eui University, Pusan, South Korea
3Department of Electrical Engineering, Dong-eui University, Pusan, South Korea
4Department of Computer Engineering, Dong-eui University, Pusan, South Korea

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Materials Letters

Tập 50

82-86

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