Nondestructive RAM testing based on multiple signature comparison
Tóm tắt
In the present article, the problem is considered of nondestructive testing of modern RAM devices by means of multiple signature comparison. It is shown that the reference signature values for each phase of a march test are determined only by the present RAM state; furthermore, the use of two kinds of signature analyzers allows performing an analysis of the testing results on completion of each phase of the test.
Tài liệu tham khảo
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