Non-Contact and In-Process Measurement of Film Coating Thickness by Combining Two Principles of Eddy-Current and Capacitance Sensing

CIRP Annals - Tập 56 - Trang 509-512 - 2007
T.O. Kim1, H.Y. Kim2, C.M. Kim3, J.H. Ahn4
1Kumoh Mach. & Elec. Co., Ltd., Busan, Korea
2Research Institute of Mechanical Technology, Pusan National University, Busan, Korea
3Department of Mechanical and Intelligent Systems Engineering, Pusan National University, Busan, Korea
4School of Mechanical Engineering, Pusan National University and ERC/NSDM, Busan, Korea

Tài liệu tham khảo

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