New improvements in energy and spatial (x, y, z) resolution in AES and XPS applications

François Reniers1, Craig Tewell2
1Faculty of Sciences, Analytical and Interfacial Chemistry, Université Libre de Bruxelles, CP-255, Bld du Triomphe, B-1050 Bruxelles, Belgium
2Los Alamos National Laboratory, Tritium Science and Engineering, Mailstop C332, Los Alamos, NM 87545, USA

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