Multipole WIEN-filter for a high-resolution X-PEEM
Tài liệu tham khảo
E. Bauer, Ultramicroscopy 12 (1985) 51.
W. Telieps, E. Bauer, Ultramicroscopy 17 (1985) 57.
E. Bauer, T. Franz, C. Koziol, G. Lilienkamp, T. Schmidt, in: R. Rosei (Eds.), Chemical, Structural and Electronic Analysis of Heterogeneous Surface on Nanometer Scale, Kluwer, Dordrecht, 1995.
H. Rose, Optik 77 (1987) 26.
M. Scheinfein, Optik 82 (1989) 99.
K. Tsuno, Optik 89 (1991) 31.
J. Chmelik, L. Veneklasen, G.K.L. Marx, Optik 83 (5) (1989) 155.
W. Engel., M.E. Kordesch, H.H. Rotermund, S. Kubala, A. von Oertzen, Ultramicroscopy 36 (1991) 148.
R. Smoluchowski, Phys. Rev. 60 (1941) 661.