Multi-frame super-resolution reconstruction based on global motion estimation using a novel CNN descriptor
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Hyde R. Eyeglass, SPIE 4849, 28 (2002).
Bay H., Ess A., Tuytelaars T. and Van Gool L., Computer Vision and image Understanding 110, 346 (2008).
Brown M., Hua G. and Winder S., IEEE Transactions on Pattern Analysis and Machine Intelligence 33, 43 (2010).
Trzcinski T., Christoudias M. and Lepetit V., IEEE Transactions on Pattern Analysis and Machine Intelligence 37, 597 (2015).
Trzcinski T., Christoudias M., Fua P. and Lepetit, V., Boosting Binary Key-Point Descriptors, IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2874 (2013).
Russakovsky O., Deng J., Su H., Krause J., Satheesh S., Ma S., Huang Z., Karpathy A., Khosla A., Bernstein M., Berg A. and Fei-Fei L., International Journal Of Computer Vision 115, 211 (2015).
Fischer P., Dosovitskiy A. and Brox T., Descriptor Matching with Convolutional Neural Networks: a Comparison to SIFT, arXiv:1405.5769, 2014.
Simo-Serra E., Trulls E., Ferraz L., Kokkinos I., Fua P. and Moreno-Noguer F., Discriminative Learning of Deep Convolutional Feature Point Descriptors, IEEE International Conference on Computer Vision, 118 (2015).
Han X., Leung T., Jia Y., Sukthankar R. and Berg A., Matchnet: Unifying Feature and Metric Learning for Patch-Based Matching, IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 3279 (2015).
Yi K., Trulls E., Lepetit V. and Fua P., LIFT: Learned Invariant Feature Transform, European Conference Computer Vision, 467 (2016).
Tian Y., Fan B., Wu F., L2-Net: Deep Learning of Discriminative Patch Descriptor in Euclidean Space, IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 6128 (2017).
Lucas B. and Kanade T., An Iterative Image Registration Technique with an Application to Stereo Vision, The 7th International Joint Conference on Artificial Intelligence, 674 (1981).
Harris C. and Stephens M., A Combined Corner and Edge Detector, The 4th Alvey Vision Conference, 10 (1988).
Keren D., Peleg S. and Brada R., Image Sequence Enhancement Using Subpixel Displacements. IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 742 (1988).
Irani M. and Peleg S., CVGIP: Graphical Models & Image Processing 53, 231 (1991).
Schultz R. and Stevenson R., IEEE Transactions on Image Processing: a Publication of the IEEE Signal Processing Society 5, 996 (1996).
Baker S. and Kanade T., IEEE Transactions on Pattern Analysis and Machine Intelligence 24, 1167 (2002).
Liao R., Tao X., Li, R., Video Super-Resolution via Deep Draft-Ensemble Learning, IEEE International Conference on Computer Vision, 531 (2015).
Kappeler A., Yoo S., Dai Q. and Katsaggelos A., IEEE Transactions on Computational Imaging 2, 109 (2016).
Caballero J., Ledig C., Aitken A., Acosta A., Totz J., Wang Z. and Shi W., Real-Time Video Super-Resolution with Spatio-Temporal Networks and Motion Compensation, IEEE Computer Vision and Pattern Recognition, 2848 (2017).
Tao X., Gao H., Liao R., Wang J. and Jia J., Detail-Revealing Deep Video Super-Resolution, IEEE International Conference on Computer Vision, 4482 (2017).
Ren S., He K., Girshick R. and Sun J., IEEE Transactions on Pattern Analysis and Machine Intelligence 39, 1137 (2017).
Verdie Y., Yi K., Fua P. and Lepetit V., TILDE: A Temporally Invariant Learned Detector, IEEE Conference on Computer Vision and Pattern Recognition, 5279 (2015).
Strecha C., Hansen W., Van Gool L., Fua P. and Thoennessen, U., On Benchmarking Camera Calibration and Multi-View Stereo for High Resolution Imagery, IEEE Conference on Computer Vision and Pattern Recognition, 1 (2008).
Rublee E., Rabaud V., Konolidge K. and Bradski G., ORB: An Efficient Alternative to SIFT or SURF, International Conference on Computer Vision, 2564 (2011).
Balntas V., Johns E., Tang L. and Mikolajczyk K., PN-Net: Conjoined Triple Deep Network for Learning Local Image Descriptors, arXiv:1601.05030, 2016.
Han X., Leung T., Jia Y., Sukthankar R. and Berg A., MatchNet: Unifying Feature and Metric Learning for Patch-Based Matching, IEEE Conference on Computer Vision and Pattern Recognition, 3279 (2015).