Sai Shi1,2,3, Chunli Pang3, Shuxi Ren3, Fude Sun3, Biao Ma1,2,3, Shuai Guo4, Junwei Li3, Yafei Chen3, Hailong An1,2,3
1State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, 300401, China
2Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin 300401, China
3Key Laboratory of Molecular Biophysics of Hebei Province, Institute of Biophysics, School of Science, Hebei University of Technology, Tianjin, 300401, China
4College of Life Science, Hebei University, Baoding 071002, Hebei, China