Modified differential overlap factor and modal gain equalization criteria-based comparative analysis of 4M-EDFA 980;1480 nm towards identification of a unique erbium doping profile for the 4M-EDFA1480 nm system
Tóm tắt
A four-mode erbium-doped fiber amplifier (4M-EDFA) system with
$${\mathrm{LP}}_{01;980 \mathrm{nm}}$$
and
$${\mathrm{LP}}_{01;1480 \mathrm{nm}}$$
pump wavelengths is explored analytically using a coupled mode equation and subsequently through simulations by implementing modified erbium-doped profile-based systems. We aim to reduce the inherent differential modal gain (DMG) and differential spectral gain (DSG) between signal modes
$${\mathrm{LP}}_{01}, {\mathrm{LP}}_{11}, {\mathrm{LP}}_{21}$$
and
$${\mathrm{LP}}_{02}$$
while maintaining high modal gain. For in-depth performance evaluation and comparison of 4M-
$${\mathrm{EDFA}}_{980\, \mathrm{nm};1480\,\mathrm{nm}}$$
systems, novel differential performance parameters are introduced and explored. Differential modal noise figure (DMNF) and differential spectral noise figure (DSNF) parameters quantify the impact of system amplified spontaneous emission. The conventional erbium ion inclusive transverse overlap factor is modified (
$${\eta }_{\mathrm{sp}}$$
) using a unit-less erbium ion profile over a scale of 0–1. Differential modal overlap factor (DMOF) and differential spectral overlap factor (DSOF) are shown to be strongly correlated with DMG and DSG, respectively, and prove to be more decisive performance evaluation parameters than
$${\eta }_{\mathrm{sp}}$$
. Obtaining low DMOF and DSOF values with the 1480 nm pump prompts the investigation of 4M-
$${\mathrm{EDFA}}_{1480\,\mathrm{nm}}$$
with erbium ion profile variants: uniform
$$N\left(r\right)$$
= 1,
$${N}_{\mathrm{inv}}\left(r\right)$$
and
$${N}_{\mathrm{opt} }(r)$$
.
$${N}_{\mathrm{inv}}\left(r\right)$$
is extracted from the inverse sum of the normalized signal intensity function. Subsequently, differential modal gain equalization criteria are used which aid in unique linearizing
$${N}_{\mathrm{opt} }(r)$$
profile identification. In the 4M-EDFA system, the highest values (in dB) of DMG, DSG, DMNF and DSNF are 13.295, 3.9717, 5.9996, 11.0649, respectively, for the 980 nm uniform erbium ion profile system. The proposed
$${N}_{\mathrm{opt}}(r)$$
profile significantly reduces these parameters (in dB) to 2.0558, 2.4997, 2.77 and 3.879, respectively, for the 1480 nm system.
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