Modeling of frequency and temperature effects in GaAs MESFETs

Institute of Electrical and Electronics Engineers (IEEE) - Tập 25 Số 1 - Trang 299-306 - 1990
P.C. Canfield1, S.C.F. Lam2,1, D.J. Allstot1
1Department of Electrical and Computer Engineering, Oregon State University, Corvallis, OR, USA
2Department of Electrical Engineering, University of Washington, Seattle, WA, USA

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