Model of partial crystallization and melting derived from small‐angle X‐ray scattering and electron microscopic studies on low‐density polyethylene

A temperature‐dependent small‐angle x‐ray scattering and electron microscopic study on a sample of low‐density polyethylene affords a determination of the structure changes in a heating and cooling cycle and suggests a new model of partial crystallization and melting. The analysis of SAXS data is based upon some general properties of the electron‐density correlation function. Electron micrographs are obtained from stained sections γ irradiated at elevated temperatures and are analyzed quantitatively by statistical means. According to the model proposed here the thickness distribution in the amorphous layers, rather than that of the crystalline regions, is the essential factor governing the crystallization and melting behavior. The temperature‐dependent changes in this thickness distribution provide a natural explanation for the large reversible changes in long‐spacing.