Minimization of phase distortions of transmitted radiation upon optical switching in vanadium dioxide film
Tóm tắt
We have numerically modeled transmission of radiation with a wavelength of λ=10.6 or 3.4 μm through a VO2 film and a change in phase of the transmitted radiation upon a transition of the film material from semiconductor to metallic state. It is established that there are optimum values of the film thickness for which the phase changes tend to zero. Conditions favoring minimization of the phase distortions are determined for a single VO2 film and a multilayer interferometer with such a film.
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