Microstructural and Crystallographic Characterization of Ni2+x Mn1−x Ga Alloys (x = 0.14, 0.16, 0.19, 0.22, and 0.24) by Transmission Electron Microscopy

Metallurgical and Materials Transactions E - Tập 1 Số 3 - Trang 239-246 - 2014
Le Zhou1, Anit K. Giri2, Kyu Cho3, Helge Heinrich4, Bhaskar Majumdar5, Yongho Sohn1
1Graduate Research Assistant, Professor, Department of Materials Science and Engineering and Advanced Materials Processing and Analysis Center, University of Central Florida, Orlando, FL, 32816, USA
2Senior Scientist, Bowhead Science and Technology, Belcamp, MD, 21005, USA
3Materials Engineer, Weapons and Materials Research Directorate, US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, MD, 21005, USA
4Associate Professor, Department of Physics and Advanced Materials Processing and Analysis Center, University of Central Florida, P.O. Box 162385, Orlando, FL, 32816, USA
5Professor, Department of Materials Science and Engineering, New Mexico Institute of Mining and Technology (NMT), Socorro, NM, 87801, USA

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Metallurgical and Materials Transactions E

Tập 1 Số 3

239-246

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