Mesoscopic fluctuations of hopping conductance of a short channel GaAs field effect transistor — Experimental testing of ergodicity

Solid State Communications - Tập 72 - Trang 743-746 - 1989
A.O. Orlov1, A.K. Savchenko1, A.V. Koslov1
1Institute of Radio engineering and Electronics, Academy of Sciences of the USSR, Moscow, 103907, USSR

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