Mechanisms of charging of insulators under irradiation with medium-energy electron beams

S. G. Boev and V. Ya. Ushakov, Radiation Accumulation of the Charge in Solid Dielectrics and the Methods Used for Its Diagnostics (Énergoatomizdat, Moscow, 1991) [in Russian].

I. M. Bronshteĭn and B. S. Fraĭman, Secondary Electron Emission (Nauka, Moscow, 1969) [in Russian].

A. R. Shul’man and S. A. Fridrikhov, Secondary Emission Methods for Investigation of Solids (Nauka, Moscow, 1977) [in Russian].

L. Reimer, U. Golla, R. Bongeler, M. Kassens, B. Schindler, and R. Senkel, Optik (Jena, Ger.) 92, 14 (1992).

D. Joy and C. Joy, Micron 27, 247 (1996).

V. V. Aristov, L. S. Kokhanchik, K. P. Meyer, and H. Blumtritt, Phys. Status Solidi A 78, 229 (1983).

J. Cazaux, J. Appl. Phys. 85, 1137 (1999).

J. Cazaux, Nucl. Instrum. Methods Phys. Res., Sect. B 244, 307 (2006).

F. Mady, R. Renoud, and J.-P. Ganachaud, J. Phys.: Condens. Matter 14, 231 (2002).

X. Meyza, D. Goeuriot, D. Treheux, and H.-J. Fitting, J. Appl. Phys. 94, 5384 (2003).

M. Touzin, D. Goeuriot, C. Guerret-Piecourt, D. Treheux, and H. J. Fitting, J. Appl. Phys. 99, 114110.1 (2006).

H. Seiler, J. Appl. Phys. 54, R1 (1983).

L. Reimer, Image Formation in Low-Voltage Scanning Electron Microscopy (SPIE, Washington, 1993).

Nunes de Olivier and B. Gross, J. Appl. Phys. 46, 3132 (1975).

Z. G. Song, C. K. Ong, and H. Gong, J. Appl. Phys. 79, 7123 (1996).

A. Melchinger and S. Hofmann, J. Appl. Phys. 78, 6224 (1995).

M. V. Andrianov, V. V. Aristov, A. V. Gostev, and É. I. Rau, Poverkhnost, No. 3, 40 (2004).

M. V. Andrianov, A. V. Gostev, É. I. Rau, Zh. Kazo, O. Zhbara, and M. Belkhanii, Poverkhnost, No. 12, 9 (2000).