Measurement of the Intrinsic Properties of Materials by Time-Domain Techniques

IEEE Transactions on Instrumentation and Measurement - Tập 19 Số 4 - Trang 377-382 - 1970
Aaron Nicolson1, G.F. Ross1
1Sperry Rand Research Center, Sudbury, MA, USA

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Từ khóa


Tài liệu tham khảo

nicolson, 1969, Wideband system function analyzer employing time to frequency domain translation, WESCON

10.1109/MSPEC.1969.5213896

10.1109/TIM.1968.4313741

1961, Dielectric Materials and Applications