Material removal on silicon towards atomic and close-to-atomic scale by infrared femtosecond laser

Materials Science in Semiconductor Processing - Tập 158 - Trang 107368 - 2023
Haojie An1, Jinshi Wang1, Fengzhou Fang1,2
1State Key Laboratory of Precision Measuring Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology (MNMT), Tianjin University, Tianjin, 300072, China
2Centre of Micro/Nano Manufacturing Technology (MNMT-Dublin), School of Mechanical and Materials Engineering, University College Dublin, Dublin 4, Ireland

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