Machine learning as a tool for classifying electron tomographic reconstructions

Advanced Structural and Chemical Imaging - Tập 1 - Trang 1-15 - 2015
Lech Staniewicz1, Paul A. Midgley1
1Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK

Tóm tắt

Electron tomographic reconstructions often contain artefacts from sources such as noise in the projections and a “missing wedge” of projection angles which can hamper quantitative analysis. We present a machine-learning approach using freely available software for analysing imperfect reconstructions to be used in place of the more traditional thresholding based on grey-level technique and show that a properly trained image classifier can achieve manual levels of accuracy even on heavily artefacted data, though if multiple reconstructions are being processed, a separate classifier will need to be trained on each reconstruction for maximum accuracy.

Tài liệu tham khảo

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