Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties

Materials Science Forum - Tập 443-444 - Trang 123-126
J. Rodrı́guez-Carvajal1, Thierry Roisnel
1CEA/Saclay

Tóm tắt

A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.

Từ khóa


Tài liệu tham khảo

R. L. Snyder, H. J. Bunge and J. Fiala: Defect and Microstructure Analysis from Diffraction (International Union of Crystallography, Oxford Science Publications, 1999).

P. Thompson, D.E. Cox and J.B. Hastings: J. Appl. Cryst. 20 (1987), p.79.

L.W. Finger: J. Appl. Cryst. 31 (1998), p.111; L.W. Finger, D.E. Cox and A. Jephcoat, J. Appl. Cryst. 27 (1997), p.892.

T. Roisnel and J. Rodríguez-Carvajal: Mater. Sci. Forum 378-381 (2000), p.118 (WinPLOTR on LLB Web site at: http: /www-llb. cea. fr/fullweb/winplotr/winplotr. htm).

A. Guinier (Dunod editor, Paris 1956).

A.R. Stokes and A.J.C. Wilson: Proc. Phys. Soc. London, 56 (1994), p.174.

J. Rodríguez-Carvajal, M.T. Fernández-Diaz and J.L. Martínez: J. Phys. : Condensed Matter 3 (1991), p.3215.

J. Rodríguez-Carvajal: “Recent developments in the program FullProf”, Commission on Powder Diffraction Newsletter 26 (2001), p.12.

P.W. Stephens: J. Appl. Cryst. 32 (1999), p.281.

Thông tin
Thông tin xuất bản

Materials Science Forum

Tập 443-444

123-126

Thông tin tác giả