Ion beam enhancement in 236UO− measurement by AMS using Si powder as the binder

Elsevier BV - Tập 456 - Trang 218-221 - 2019
Z.H. Kazi1,2, C.R.J. Charles2,3, X.L. Zhao4,2, R.J. Cornett1,2, W.E. Kieser4,2
1Department of Earth and Environmental Sciences, University of Ottawa, 25 Templeton St., Ottawa, ON K1N 6N5, Canada
2A. E. Lalonde AMS Laboratory, University of Ottawa, 25 Templeton St., Ottawa, ON K1N 6N5, Canada
3TRIUMF, 4004 Westbrook Mall, Vancouver, BC V6T 2A3, Canada
4Department of Physics, University of Ottawa, 25 Templeton St, Ottawa, ON K1N 6N5, Canada

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Elsevier BV

Tập 456

218-221

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