Investigation on method of reducing surface leakage current of the CdZnTe photoconductive detector with MSM structure

Materials Science in Semiconductor Processing - Tập 137 - Trang 106234 - 2022
Chengjie Feng1, Jiahua Min1, Xiaoyan Liang1, Jijun Zhang1, Linjun Wang1,2, Yue Shen1
1School of Materials Science and Engineering, Shanghai University, Shanghai, 200444, China
2Zhejiang Institute of Advanced Materials, SHU, Jiashan, 314113, China

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