Inhomogeneity of amorphous silicon thin films from optical transmission and reflection measurements

Journal of Non-Crystalline Solids - Tập 137 - Trang 619-622 - 1991
T. Pisarkiewicz1, T. Stapinski1, H. Czternastek1, P. Rava2
1Dept. of Physics and Electron Technology, Academy of Mining and Metallurgy, al. Mickiewicza 30, 30-059 Cracow, Poland
2Elettrorava SpA, 10040 Savonera, Torino, Italy

Tài liệu tham khảo

Cody, 1984, The optical absorption edge of a-Si:H, Vol. 21B, 11

Freeman, 1979, Phys. Rev., B20, 716, 10.1103/PhysRevB.20.716

Demichelis, 1986, Phys. Rev., B33, 7022, 10.1103/PhysRevB.33.7022

Swanepoel, 1985, Thin Solid Films, 128, 191, 10.1016/0040-6090(85)90071-9

Ferraton, 1989, Thin Solid Films, 173, 155, 10.1016/0040-6090(89)90130-2

Manifacier, 1976, J. Phys., E9, 1002

Swanepoel, 1983, J. Phys., E16, 1214

Swanepoel, 1984, J. Phys., E17, 896

Czapla, 1988, Elektrotechnika, 7, 313

Bennet, 1967, Vol. 4

Szczyrbowski, 1978, J. Phys., D11, 583

Jacobsson, 1966, Vol. 5

Knittl, 1976

Szczyrbowski, 1979, J. Phys., D12, 1737

Pisarkiewicz, 1991, Acta Phys. Polonica, A79, 203, 10.12693/APhysPolA.79.203

Rava, 1991