Influence of incident beam divergence on the intensity of diffuse streaks

Bulletin of Materials Science - Tập 7 - Trang 499-507 - 1985
Dhananjai Pandey1, S Lele2, Lalita Prasad, J P Gauthier3
1School of Materials Science and Technology, Banaras Hindu University, Varanasi, India
2Department of Metallurgical Engineering, Banaras Hindu University, Varanasi, India
3Laboratoire de Mineralogie-Cristallographie, Universite’ Claude Bernard Lyon I, Villeurbanne Cedex, France

Tóm tắt

The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relpHK·L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.

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