Improved Bayesian image denoising based on wavelets with applications to electron microscopy

Pattern Recognition - Tập 39 - Trang 1205-1213 - 2006
C.O.S. Sorzano1,2, E. Ortiz1, M. López3, J. Rodrigo4
1Dept. Sistemas Electrónicos y de Telecomunicación, Escuela Politécnica Superior, Univ. San Pablo-CEU, Urb. Montepríncipe s/n, Boadilla del Monte, 28668 Madrid, Spain
2Biocomputing Unit, National Center of Biotechnology (CSIC), Campus Univ. Autónoma s/n, 28049 Madrid, Spain
3Dept. Matemática e Informática Aplicadas a la Ingeniería Civil, E.T.S. Ingenieros de Caminos, Univ. Politécnicade Madrid, Ciudad Universitaria s/n, 28040 Madrid, Spain
4Dept. Matemática Aplicada, E.T.S. Ingeniería, Univ. Pontificia Comillas, c/Alberto Aguilera, 23, 28015 Madrid, Spain

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