High-resolution photothermal imaging of near-surface defects in materials and components

NDT & E International - Tập 27 - Trang 185-189 - 1994
E. Winschuh1, K.-H. Winterberg1, M. Kröning2
1Siemens AG (KWU), Power Generation Group, Offenbach, Germany
2Fraunhofer Institut für zerstörungsfreie Prüfung, Saarbrücken, Germany

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