Hardness assurance for space system microelectronics

Radiation Physics and Chemistry - Tập 43 - Trang 191-204 - 1994
Ronald L. Pease1, David R. Alexander1
1Mission Research Corporation, 1720 Randolph Road SE, Albuquerque, NM 87106, U.S.A.

Tài liệu tham khảo

Abou-Auf, 1991, A PC program to calculate the one-sided lower tolerance limit for total ionizing radiation data, HDL-TM-91-12 Alexander, 1981, Component statistical characterization, AFWL-TR-80-128 Azarewicz, 1985, Dose rate hardness assurance guidelines, DNA-TR-86-29 Browning, 1987, Hardness assurance based on system reliability models, IEEE Trans. Nucl. Sci., NS-34 Eisen, 1982, Radiation effects on semiconductor devices, HDL-DS-82-1 Espig, 1989, Summary of nuclear radiation effects data on large scale integrated circuits, DASIAC-SR-89-041 Ferry, 1993, Ionizing radiation and neutron displacement damage hardness assurance guidelines for semiconductor devices and microcircuits, MIL-HDBK-814 Ferry, 1976, Nuclear hardness assurance guidelines for systems with moderate requirements, AFWL-TR-76-147 Fleetwood, 1991, Hardness assurance for low-dose space applications, IEEE Trans. Nucl. Sci., NS-38 Maier, 1983, Low power error correction architecture for space, IEEE Trans. Nucl. Sci., NS-30 Martin, 1985, Total dose radiation effects data for semiconductor devices, JPL 85-43 Merker, 1984, RAD-PAK: radiation shielding for IC's at the package level, AFWL-TR-83-117 Namenson, 1981, Piece part neutron hardness assurance guidelines for semiconductor devices, DNA 5910F Nichols, 1991, Update on parts SEE susceptibility from heavy ions, IEEE Trans. Nucl. Sci., NS-38 Pease, 1988, Radiation testing of semiconductor devices for space electronics, Proc. IEEE, 76, 10.1109/5.90110 Pease, 1986, Hardness assurance guidelines for MIL-HDBK-339 (USAF) custom large scale iotegrated circuit development and acquisition for space vehicles, DNA-TR-86-38 1981, Phase III completion report, total dose hardness assurance, AFWL-TR-80-137 Price, 1982, Total-dose hardness assurance guidelines for semi-conductor devices, DNA5909F