Growth of heavy ion-induced nanodots at the SiO2–Si interface: Correlation with ultrathin gate oxide reliability

Journal of Non-Crystalline Solids - Tập 351 - Trang 3834-3838 - 2005
A.D. Touboul1, J.F. Carlotti1, M. Marinoni1, M. Caussanel2, M. Ramonda3, C. Guasch4, G. Bruguier1, J. Bonnet4, F. Saigné1, J. Gasiot1
1CEM2-UMR CNRS 5507, Université Montpellier II, F-34095 Montpellier cedex 5, France
2Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235, United States
3LMCP, Université Montpellier II, F-34095 Montpellier cedex 5, France
4LAIN-UMR CNRS 5011, Université Montpellier II, F-34095 Montpellier cedex 5, France

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