Growth of heavy ion-induced nanodots at the SiO2–Si interface: Correlation with ultrathin gate oxide reliability
Tài liệu tham khảo
Wilson, 1912, Proc. R. Soc. London, Series-A, 87, 277, 10.1098/rspa.1912.0081
Hahn, 1939, Naturwissenschaften, 27, 544, 10.1007/BF01495447
Joliot, 1939, CR Acad. Sci. II, 208, 647
Corson, 1939, Phys. Rev., 55, 509, 10.1103/PhysRev.55.509
Brostrom, 1940, Phys. Rev., 58, 651, 10.1103/PhysRev.58.651
Young, 1958, Nature, 182, 375, 10.1038/182375a0
Fleischer, 1963, J. Appl. Phys., 34, 2903, 10.1063/1.1729828
Fleischer, 1963, Science, 140, 1221, 10.1126/science.140.3572.1221
Price, 1962, J. Appl. Phys., 33, 3407, 10.1063/1.1702421
Price, 1962, J. Appl. Phys., 33, 2625, 10.1063/1.1729031
Suehle, 2002, Appl. Phys. Lett., 80, 1282, 10.1063/1.1448859
J.F. Ziegler, J.P. Biersack, U. Littmark, Pergamon, New York, 1985.
Brinkman, 1954, J. Appl. Phys., 25, 961, 10.1063/1.1721810
Fleischer, 1995, MRS Bull., 20, 17, 10.1557/S0883769400045851
R.L. Fleischer, P.B. Price, R.M. Walker, University of California, Berkeley, 1975.
Kaganov, 1957, Sov. Phys. JETP-USSR, 4, 173
Dienes, 1953, Ann. Rev. Nucl. Sci., 2, 187, 10.1146/annurev.ns.02.120153.001155
Toulemonde, 2004, Nucl. Instrum. Methods B, 216, 1, 10.1016/j.nimb.2003.11.013
Bonfiglioli, 1961, J. Appl. Phys., 32, 2499, 10.1063/1.1728339
Dartyge, 1981, Phys. Rev. B, 23, 5213, 10.1103/PhysRevB.23.5213
K. Izui, S. Furuno, in: Proc. XIth Int. Cong. on Electron Microscopy Kyoto (1986) p. 1299.
Chaudhari, 2003, J. Appl. Phys., 93, 3486, 10.1063/1.1542913
Cester, 2001, Appl. Phys. Lett., 79, 1336, 10.1063/1.1398329
M. Porti, M. Nafria, X. Aymerich, et al., in: Proc. of RADECS Int. Conf. (2004) p. 17.
Sexton, 1997, IEEE Trans. Nucl. Sci., 44, 2345, 10.1109/23.659060
Johnston, 1998, IEEE Trans. Nucl. Sci., 45, 2500, 10.1109/23.736491
Conley, 2001, IEEE Trans. Nucl. Sci., 48, 1913, 10.1109/23.983150
Ceschia, 2000, IEEE Trans. Nucl. Sci., 47, 566, 10.1109/23.856481
Suñé, 1999, Appl. Phys. Lett., 75, 959, 10.1063/1.124566
Toulemonde, 2004, Nucl. Instrum. Methods B, 216, 1, 10.1016/j.nimb.2003.11.013
Awazu, 2000, Phys. Rev. B, 62, 3689, 10.1103/PhysRevB.62.3689
Toulemonde, 1990, Nucl. Instrum. Methods B, 46, 64, 10.1016/0168-583X(90)90670-P
Merkle, 1962, Phys. Rev. Lett., 9, 150, 10.1103/PhysRevLett.9.150
Meftah, 1991, Nucl. Instrum. Methods B, 59&60, 605, 10.1016/0168-583X(91)95286-M