Further Characterisation of the 91500 Zircon Crystal
Tóm tắt
This paper reports the results from a second characterisation of the 91500 zircon, including data from electron probe microanalysis, laser ablation inductively coupled plasma‐mass spectrometry (LA‐ICP‐MS), secondary ion mass spectrometry (SIMS) and laser fluorination analyses. The focus of this initiative was to establish the suitability of this large single zircon crystal for calibrating
Từ khóa
Tài liệu tham khảo
Armstrong J.T., 1995, CITZAF: A package of correction programs for the quantitative electron microbeam X‐ray analysis of thick polished materials, thin films and particles, Microbeam Analysis, 4, 177
Hewitt D.F., 1953, Geology of the Brudenell‐Raglan Area, Annual Report of the Ontario Department of Mines, 62, 85
Morishita Y., 1998, Secondary Ion Mass Spectrometry, SIMS XI, 67
Morishita Y, 2000, Secondary Ion Mass Spectrometry, SIMS XII, 1003
Sharp Z.D., 1992, In situ laser microprobe techniques for stable isotope analysis, Chemical Geology, 101, 3
Stem R.A., 2001, A new isotopic and trace‐element standard for the ion microprobe: Preliminary thermal ionization mass spectrometry (TIMS) U‐Pb and electron‐microprobe data, 11