Formation of multilayer polytypes in ain during sintering

A new multilayer polytype of aluminum nitride has been discovered, forming during the sintering of powdered aluminum nitride under conditions ensuring oxygen diffusion into its lattice. It has been found by the electron diffraction technique, using double diffraction effects, that the multilayer polytype has the 165R structure. An x-ray diffraction study has revealed the presence in the wurtzite AIN modification of interstitial stacking faults, whose concentration falls with rise to sintering temperature. This is attributable to the expenditure of the stacking faults on the formation of multilayer polytypes.