Formation of hafnium-aluminum-oxide gate dielectric using single cocktail liquid source in MOCVD process

IEEE Transactions on Electron Devices - Tập 50 Số 10 - Trang 2088-2094 - 2003
Moon Sig Joo1, Byung Jin Cho1, Chia Ching Yeo1, D.S.H. Chan, Sung Jin Whoang2, S. Mathew3, L. K. Bera3, N. Balasubramanian3, Dim‐Lee Kwong4
1Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, National University of Singapore, Singapore
2JUSUNG Engineering Company Limited, Gyeonggi, South Korea
3Institute of Microelectronics, Singapore
4Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA

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Tài liệu tham khảo

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