Fluence dependence of the interband critical points in ion-implanted silicon

Elsevier BV - Tập 168 - Trang 510-520 - 2000
M.A El-Sherbiny1, H.H El-Bahnasawy1, M.M El-Ocker1
1Physics Department, Faculty of Science, Al-Azhar University, Madinet Nasr., Cairo 11884, Egypt

Tài liệu tham khảo

El-Sherbiny, 1996, Nucl. Instr. and Meth. B, 118, 728, 10.1016/0168-583X(95)01110-2 T. Lohner, M.A. El-Sherbiny, N.Q. Khanh, M. Fried, H. Wormeester, J. Gyulai, in: J.S. Williames, R.G. Elliman, M.C. Ridgway (Eds.), Ion Beam Modification of Materials, Elservier, Amsterdam, 1995, p. 797 Flueraru, 1996, J. Phys. III France, 6, 225, 10.1051/jp3:1996120 Lautenschlager, 1987, Phys. Rev. B, 36, 4821, 10.1103/PhysRevB.36.4821 Masaki, 1993, J. Appl. Phys., 74, 129, 10.1063/1.354144 Daunois, 1978, Phys. Rev. B, 18, 1824, 10.1103/PhysRevB.18.1824 Kane, 1966, Phys. Rev., 146, 558, 10.1103/PhysRev.146.558 Cardona, 1967, Phys. Rev., 154, 696, 10.1103/PhysRev.154.696 Grover, 1974, Phys. Rev. B, 9, 2600, 10.1103/PhysRevB.9.2600 Jungk, 1980, Phys. Stat. Sol. B, 99, 643, 10.1002/pssb.2220990224 Kondo, 1976, Phys. Rev. B, 14, 1577, 10.1103/PhysRevB.14.1577 Chelikowky, 1974, Phys. Rev. B, 10, 5095, 10.1103/PhysRevB.10.5095 Adachi, 1989, J. Appl. Phys., 66, 3224, 10.1063/1.344140 McMarr, 1986, J Appl. Phys., 59, 694, 10.1063/1.336639 Vanhellemont, 1991, Nucl. Instr. and Meth. B, 55, 183, 10.1016/0168-583X(91)96158-H Fried, 1992, J. Appl. Phys., 71, 2835, 10.1063/1.351014 Lynch, 1993, Thin Solid Films, 233, 199, 10.1016/0040-6090(93)90089-8 M. Cardona, in: F. Seitz, D. Turnbull, H. Ehrenreich (Eds.), Solid State Physics (Suppl. 11), Academic Press, New York, 1969 D.E. Aspnes, in: M. Balkanski, (Ed.), Handbook on Semiconductors, Vol. 2, North-Holland, Amsterdam, 1980, p. 109 Lautenschlager, 1987, Phys. Rev. B, 36, 4821, 10.1103/PhysRevB.36.4821 Kahen, 1985, Phys. Rev. B, 32, 5177, 10.1103/PhysRevB.32.5177 Vina, 1984, Phys. Rev. B, 29, 6739, 10.1103/PhysRevB.29.6739 Elliott, 1974