Film thickness effect on fractality of tin-doped In2O3 thin films

Springer Science and Business Media LLC - Tập 11 Số 5 - Trang 749-757 - 2015
Ştefan Ţălu1, Sebastian Stach2, Davood Raoufi3, Fayegh Hosseinpanahi4
1Faculty of Mechanical Engineering, Department of AET, Discipline of Descriptive Geometry and Engineering Graphics, Technical University of Cluj-Napoca, 103-105 B-dul Muncii St., Cluj-Napoca, 400641, Cluj, Romania
2Faculty of Computer Science and Materials Science, Institute of Informatics, Department of Biomedical Computer Systems, University of Silesia, Będzińska 39, 41-205, Sosnowiec, Poland
3Department of Physics, University of Bu Ali Sina, P.O. Box 65174, Hamedan, Iran
4Department of Physics, Payame Noor University, P.O. Box 19395-4697, Tehran, Iran

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