Fault diagnosis of discrete-event systems under a general architecture

Jianxin Tan1,2, Fuchun Liu1, Rui Zhao1, Yuan Tian3, Najla Al-Nabhan4
1School of Computers, Guangdong University of Technology, Guangzhou, China
2Network Information Center, Guangdong University of Finance and Economics, Guangzhou, China
3School of Computer Engineering, Nanjing Institute of Technology, Nanjing, China
4Department of Computer Science, King Saud University, Riyadh, Saudi Arabia

Tóm tắt

Diagnosability is an important characteristic indicator to determine whether the system is stable and reliable. In this paper, the general architecture of event-state-combination diagnosability is investigated. The contributions are threefold. First, the notion of event-state-combination diagnosability is formalized. Roughly speaking, an event-state-combination diagnosable system means that not only each combined fault can be detected, but also the system can determine whether it will work permanently in the failure states after the combined fault occurs. Then, an automaton with new information structure, called event-state-combination verifier, is constructed, which can be used for the verification of the event-state-combination diagnosability. Finally, the necessary and sufficient conditions for verifying whether the system is event-state-combination diagnosable is presented, that is, the event-state-combination verifier does not have any failure confused cycle.

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