Failure event prediction using the Cox proportional hazard model driven by frequent failure signatures

Informa UK Limited - Tập 39 Số 3 - Trang 303-315 - 2007
Zhiguo Li1, Shiyu Zhou1, Suresh Choubey2, Crispian Sievenpiper2
1Department of Industrial and Systems Engineering, University of Wisconsin, Madison, WI 53706, USA
2GE HealthCare , Global Service Technology , Waukesha, WI, 53186, USA

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.2307/2291569

Agrawal R., 1996, Australian Computer Science Communications, 18, 119

Chen, Y. L. and Provan, G. Modeling and diagnosis of timed discrete event systems—a factory automation example. Presented at the American Control Conference. Albuquerque, NM.

Cox D. R., 1972, Journal of the Royal Statistical Society B, 34, 187

Cox D. R., 1989, The Analysis of Binary Data,, 2

Das, S. R. and Holloway, L. E. Learning of time templates from system observation. Presented at the American Control Conference. Seattle, WA.

Dunham M. H., 2003, Data Mining: Introductory and Advanced Topics

10.1109/24.103013

George L., 2003, The Journal of the RAC, 11, 1

Holloway L. E., 1996, Integrated Computer-Aided Engineering, 3, 244, 10.3233/ICA-1996-3402

Holloway, L. E. and Chand, S. Time templates for discrete event fault monitoring in manufacturing systems. Presented at the American Control Conference. Baltimore, MD.

10.1111/j.0006-341X.1999.00013.x

10.1007/978-1-4612-1304-8

Klein J. P., 2003, Survival Analysis: Techniques for Censored and Truncated Data, 10.1007/b97377

Klemettinen M., 1999, A knowledge discovery methodology for telecommunication network alarm databases

10.1002/sim.1674

10.1023/A:1009748302351

Misra K. B., 1992, Reliability Analysis and Prediction: A Methodology Oriented Treatment

10.1109/9.855548

10.1093/biomet/68.2.373

Sampath, M., Sungupta, R., Lafortune, S., Sinnamohideen, K. and Teneketzis, D. Diagnosability of discrete event systems. Presented at the 11th International Conference on Analysis and Optimization of Systems: Discrete Event Systems. Sophia Antipolis, France.

10.1109/21.247896

Valette, R., Cardoso, J. and Dubois, D. Monitoring manufacturing systems by means of petri nets with imprecise markings. Proceedings of the IEEE Conference on Intelligent Control. pp.233–238. Piscataway, NJ: Institute of Electrical and Electronics Engineers.

10.1002/sim.4780122407

Wasserman G. S., 2003, Reliability Verification, Testing, and Analysis in Engineering Design

10.2307/2290084

10.1016/S0169-023X(01)00039-8