Estimating the strength of single-ended dislocation sources in micron-sized single crystals

Philosophical Magazine - Tập 87 Số 30 - Trang 4777-4794 - 2007
S.I. Rao1, Dennis M. Dimiduk2, Meijie Tang3, Michael D. Uchic2, Triplicane A. Parthasarathy1, C. Woodward4
1UES Inc., 4401 Dayton-Xenia Rd., Dayton, OH 45432-1894, USA
2Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/MLLM, Wright-Patterson AFB, OH 45433-7817, USA
3Lawrence Livermore National Laboratory, P.O. Box 808, L-45, Livermore, CA 94551, USA
4Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, IL 60208-3108, USA

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